dc.contributor.author | DOROGAN, Valerian | |
dc.contributor.author | ZAPOROJAN, Sergiu | |
dc.contributor.author | MUNTEANU, Eugen | |
dc.contributor.author | LARIN, Vladimir | |
dc.contributor.author | PAVEL, Victor | |
dc.contributor.author | VIERU, Tatiana | |
dc.contributor.author | SECRIERU, Vitalie | |
dc.contributor.author | VIERU, Stanislav | |
dc.contributor.author | CALMÎCOV, Igor | |
dc.date.accessioned | 2022-09-01T10:11:34Z | |
dc.date.available | 2022-09-01T10:11:34Z | |
dc.date.issued | 2014 | |
dc.identifier.citation | DOROGAN, Valerian, ZAPOROJAN, Sergiu, MUNTEANU, Eugen et al. System for measuring the nucleus diameter and coating thickness of the microwire. In: European Exhibition of Creativity and Innovation: proc. of the 6th ed. EUROINVENT, Iasi, Romania, 2014, pp. 87-88. ISBN: 978-606-714-037-8. | en_US |
dc.identifier.isbn | 978-606-714-037-8 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/20974 | |
dc.description | Patent Application no. S2013 0215 of 12/18/2013. Exibits Clasification: Class no. 5. Industrial and laboratory equipments | en_US |
dc.description.abstract | The system is intended for measuring the diameter of the microwire nucleus and the coating thickness. On the side irradiation of a microwire with visible light, the nucleus will fully absorb the light and the coating partially or even will be opaque for the visible light. For ultraviolet the glass coating has a less transparency than for visible light. Using the measured coefficients of transparency, and calculating the ratio of their transparency and overlapping with the known characteristics, we can calculate the geometric parameters. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Romanian Inventors Forum | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | invenţii | en_US |
dc.subject | inventions | en_US |
dc.subject | microwires | en_US |
dc.subject | microwire nucleus | en_US |
dc.subject | microwire coating | en_US |
dc.title | System for measuring the nucleus diameter and coating thickness of the microwire | en_US |
dc.type | Article | en_US |
The following license files are associated with this item: