Browsing 2009 by Title

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  • LUPAN, Elena; CIORNEA, Viorel; IOVU, Mihail (Technical University of Moldova, 2009)
    The absorption spectra in the visible and near IR regions for Ga0.017Ge0.25As0.083S0.65 are investigated. The visible luminescence from Dy3+, and co-doped with Ho3+ and Dy3+ ions embedded in Ga0.017Ge0.25As0.083S0.65 glass ...
  • COJUHARI, Irina (Technical University of Moldova, 2009)
    A tuning algorithm of linear controllers P, PI, PID in multiple-loop feedback control systems is proposed in this paper. The control objects consist of three subprocesses, which are described by dynamical models with inertia ...
  • COJUHARI, Irina; IZVOREANU, Bartolomeu (Technical University of Moldova, 2009)
    A tuning algorithm of linear controllers P, PI, PID in multiple-loop feedback control systems with three contours is proposed in this paper. The control objects consists from three subprocesses, which are described by ...
  • CALMÎCOV, Igor (Technical University of Moldova, 2009)
    În acest articol este descrisă o aplicaţie de segmentare a imaginilor a picăturii de aliaj preluate de camera video. Procesând aceste imagini în timp real sunt extrase unele caracteristici ai formei, în baza cărora se pot ...
  • CARBUNE, Viorel; ZAPOROJAN, Sergiu (Technical University of Moldova, 2009)
    The numerical algorithms often bring a lot of elementary calculations which involve the fixed-point multiply, add and subtract operations. Many of these numerical and signal processing algorithms require repetitive use of ...
  • MANU, Octavian; DIMIAN, Mihai; NIEUWENHUYSE, Anneleen Van; GRAUR, Adrian (Technical University of Moldova, 2009)
    This paper presents an analysis of radiation pattern and beamforming in phased antenna arrays for indoor localization and scanning based on a triangulation technique. Beamforming is obtained and steered by applying a linear ...
  • AL-AJMI, Mohammed A (Technical University of Moldova, 2009)
    This work provides an exact analytical dynamics of a cantilever beam bonded with a piezoelectric patch to extract the modal frequencies under open circuit and short circuit electrodes’ conditions. The modal open circuit ...
  • CHAUDHRY, Amit; ROY, J. N. (Technical University of Moldova, 2009)
    In this paper an analytical model has been developed to study the Energy Quantization Effects occurring in the MOSFETs (Metal Oxide Semiconductor Field Effect Oxide) under various conditions. These effects have resulted ...
  • MAGARIU, Nicolae (Technical University of Moldova, 2009)
    The method of data handling processes modeling by means of transition diagrams and transition diagram systems is considered. As well as the method of program specification construction on base of dynamic model representation ...
  • MIRONOV, Bettin (Technical University of Moldova, 2009)
    The spectral decomposition is one of the most fruitful methods applied in technique. However more often spectroscopic decomposition is applied to signals and functions, time-dependent, less often from spatial coordinates. ...
  • SURDU, A.; KOCH, Th.; ZDRAVKOV, V.; SOCROVISCHIUC, A.; PREPELITSA, A.; OBERMAIER, G.; WIXFORTH, A.; HAHN, H.; SIDORENKO, A. S. (Technical University of Moldova, 2009)
    Superconducting properties of high-quality films of the first multiband superconductor, magnesium diboride, have been investigated. The dominating role of thermally activated flux flow for the low parts of the superconducting ...
  • NASTAS, Vitalie (Technical University of Moldova, 2009)
    The paper relates about some aspects of application of the metrological impedance simulators (MIS) for high precision impedance measurement. The classification of these devices and the most important requirements are ...
  • COJOCARU, Ion; ŞERBANAŢI, Luca; PĂVĂLOIU, Bujor; RADOVICI, Alexandru; VASILOŢEANU, Andrei (Technical University of Moldova, 2009)
    Once with the enhancement of the integrated circuits (IC), the number of tests and the time of creating them was augmenting much, and the detecting errors tests from the combinational circuits (CC) with convergent fan-out ...
  • DYNTU, M.; DONU, S.; IACOBCIUC, D. (Technical University of Moldova, 2009)
    The paper presents the results of mechanical bend testing of tin doped bismuth microwire in glass isolation with internal diameters (1.5 – 15) μm and external (10 – 60) μm. The impurity of tin in quantity 0.01, 0.05 and ...
  • CATERENCIUC, Svetlana (Technical University of Moldova, 2009)
    This paper is mainly an introduction to some of the terminology required in the study of word formation. Much of the terminology used will help place word-formation in its broader framework. The study of word-formation is ...
  • VERLAN, V. I.; BUZURNIUC, S. A. (Technical University of Moldova, 2009)
    Thin layers of amorphous chalcogenides semiconductors of mixed composition As2(SxSe1-x)3 for х in the interval 0 - 1 were obtained from chemical solutions of compounds arsenic selenide (As2Se3) and arsenic sulfide (As2S3). ...
  • BARANOV, Simion; CINIC, Boris; DUDCA, Tudor; SUMAN, Victor (Technical University of Moldova, 2009)
    Thise investigations are referred to power semiconductor devices (PSD) area manufactured by gallium arsenide (GaAs) advanced technology. The work’s objective is excluding the break-down effect on the p-n junction surface ...
  • CIORBĂ, Dumitru; BEŞLIU, Victor (Technical University of Moldova, 2009)
    Utilizarea tehnicilor formale sau semi-formale în procesele de proiectare, în cel mai apropiat timp poate duce la apariţia unor instrumente automatizate de design şi refactoring a sistemelor obiect-orientate. Iar prin ...
  • SPRINCEAN, V.; COJOCARU, A.; MONAICO, E.; TIGINYANU, I.; FÖLL, H. (Technical University of Moldova, 2009)
    In this paper we present the possibility for nanostructuring of InP using an electrolyte based on aqueous solution of NaCl. A classical grow of columnar pores was obtained. In particular it was observed that there is no ...
  • COJOCARU, Ion; ŞERBANAŢI, Luca; PĂVĂLOIU, Bujor; RADOVICI, Alexandru; VASILOŢEANU, Andrei (Technical University of Moldova, 2009)
    Functionality increase led to maximizing of the integrated circuits (IC) complexity. The time for test generation reached up to 10-15 months, and some of the faults of the combinational circuits (CC) with convergent fan-outs ...

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