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Analytical modeling of energy quantization effects in MOSFETs

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dc.contributor.author CHAUDHRY, Amit
dc.contributor.author ROY, J. N.
dc.date.accessioned 2024-01-09T07:55:42Z
dc.date.available 2024-01-09T07:55:42Z
dc.date.issued 2009
dc.identifier.citation CHAUDHRY, Amit, ROY, J. N. Analytical modeling of energy quantization effects in MOSFETs. In: Microelectronics and Computer Science: proc. 6th International Conference, 1-3 Oct. 2009, Chişinău, Republica Moldova, vol. 1, 2009, pp. 107-110. ISBN 978-9975-45-045-4. ISBN 978-9975-45-122-2 (vol. 1). en_US
dc.identifier.isbn 978-9975-45-045-4
dc.identifier.isbn 978-9975-45-122-2
dc.identifier.uri http://repository.utm.md/handle/5014/25734
dc.description.abstract In this paper an analytical model has been developed to study the Energy Quantization Effects occurring in the MOSFETs (Metal Oxide Semiconductor Field Effect Oxide) under various conditions. These effects have resulted in a reduction in drain current and degradation of gate capacitance. en_US
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.relation.ispartof Proceeding of the 6th International Conference on "Microelectronics and Computer Science", oct.1-3, 2009, Chişinău, Moldova
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject metal oxide semiconductor field effect oxide (MOSFET) en_US
dc.subject energy quantization en_US
dc.subject drain-induced barrier lowering (DIBL) en_US
dc.title Analytical modeling of energy quantization effects in MOSFETs en_US
dc.type Article en_US


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