First Sharp Diffraction Peak features of the intermediate phase glasses and amorphous thin films in the non-stoichiometric (GeS4)x(AsS3)1-x system

CIOBANU, M.; GALCA, A. C.; SAVA, F.; ZAKI, M. Y.; VELEA, A.; TSIULYANU, D.

dc.contributor.author	CIOBANU, M.
dc.contributor.author	GALCA, A. C.
dc.contributor.author	SAVA, F.
dc.contributor.author	ZAKI, M. Y.
dc.contributor.author	VELEA, A.
dc.contributor.author	TSIULYANU, D.
dc.date.accessioned	2024-06-24T06:43:08Z
dc.date.available	2024-06-24T06:43:08Z
dc.date.issued	2023
dc.identifier.citation	CIOBANU, M. et al. First Sharp Diffraction Peak features of the intermediate phase glasses and amorphous thin films in the non-stoichiometric (GeS4)x(AsS3)1-x system. In: Thin Solid Films, 2023, vol. 773, nr. 2, pp. 139828. e-ISSN 0040-6090.	en_US
dc.identifier.issn	0040-6090
dc.identifier.uri	https://doi.org/10.1016/j.tsf.2023.139828
dc.identifier.uri	http://repository.utm.md/handle/5014/27570
dc.description	Acces full text - https://doi.org/10.1016/j.tsf.2023.139828	en_US
dc.description.abstract	Grazing incidence X-ray scattering (GIXRS) patterns of thin solid films based on non-stoichiometric chalcogenide glasses (ChG) from the pseudo - binary system (GeS4)x(AsS3)1-x were studied with a focus on the First Sharp Diffraction Peak (FSDP), assigned to the middle range order (MRO) of the glassy material.	en_US
dc.language.iso	en	en_US
dc.publisher	Elsevier	en_US
dc.relation.ispartofseries	Thin Solid Films;2023, vol. 773
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	chalcogenides glasses	en_US
dc.subject	thin solid films	en_US
dc.title	First Sharp Diffraction Peak features of the intermediate phase glasses and amorphous thin films in the non-stoichiometric (GeS4)x(AsS3)1-x system	en_US
dc.type	Article	en_US