dc.contributor.author | GRIŢCOV, Serghei | |
dc.date.accessioned | 2019-07-15T09:13:58Z | |
dc.date.available | 2019-07-15T09:13:58Z | |
dc.date.issued | 2015 | |
dc.identifier.citation | GRIŢCOV, Serghei. Algorithmic Complexity of Pseudo-Ring Testing for Stuck-at Faults. In: Telecomunicaţii, Electronică şi Informatică: proc. of the 5th intern. conf., May 20-23, 2015. Chişinău, 2015, pp. 75-76. ISBN 978-9975-45-377-6. | en_US |
dc.identifier.isbn | 978-9975-45-377-6 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/3529 | |
dc.description.abstract | This paper describes calculation of algorithmic complexity of pseudo-ring testing obtained by simulation of stuck-at faults and realization of pseudo-ring testing of 4-bit and 8-bit memory. The method is designed for both bit- and wordoriented memory and it is invariant to the width of data bus of the memory. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Technical University of Moldova | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | pseudo-ring testing | en_US |
dc.subject | algorithmic complexity | en_US |
dc.subject | stuck-at faults | en_US |
dc.subject | bit width invariance | en_US |
dc.subject | generators polynomials | en_US |
dc.subject | teste cu pseudo-inele | en_US |
dc.title | Algorithmic Complexity of Pseudo-Ring Testing for Stuck-at Faults | en_US |
dc.type | Article | en_US |
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