dc.contributor.author | ГРИЦКОВ, С. | |
dc.date.accessioned | 2019-07-16T08:58:04Z | |
dc.date.available | 2019-07-16T08:58:04Z | |
dc.date.issued | 2015 | |
dc.identifier.citation | ГРИЦКОВ, С. Π-тестирование с применением LFSR на основе приводимых полиномов. In: Telecomunicaţii, Electronică şi Informatică: proc. of the 5th intern. conf., May 20-23, 2015. Chişinău, 2015, pp. 130-131. ISBN 978-9975-45-377-6. | en_US |
dc.identifier.isbn | 978-9975-45-377-6 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/3545 | |
dc.description.abstract | In this paper pseudo-ring testing of digital memory with LFSR on bases of reducible polynomial is described. Resolution of this kind of pseudo-ring tests is presented for stuckat and coupled faults, and comparative analysis was performed regarding classical pseudo-ring tests. | en_US |
dc.language.iso | ru | en_US |
dc.publisher | Technical University of Moldova | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | linear-feedback shift register | en_US |
dc.subject | LFSR | en_US |
dc.subject | pseudo-ring tests | en_US |
dc.subject | reducible polynomial | en_US |
dc.subject | π-testing | en_US |
dc.subject | testarea memoriei digitale | en_US |
dc.subject | polinome reductibile | en_US |
dc.subject | teste pseudo-inel | en_US |
dc.subject | π-testare | en_US |
dc.subject | тестирование цифровой памяти | en_US |
dc.subject | приводимый полином | en_US |
dc.subject | π-тестирование | en_US |
dc.title | Π-тестирование с применением LFSR на основе приводимых полиномов | en_US |
dc.type | Article | en_US |
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