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Π-тестирование с применением LFSR на основе приводимых полиномов

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dc.contributor.author ГРИЦКОВ, С.
dc.date.accessioned 2019-07-16T08:58:04Z
dc.date.available 2019-07-16T08:58:04Z
dc.date.issued 2015
dc.identifier.citation ГРИЦКОВ, С. Π-тестирование с применением LFSR на основе приводимых полиномов. In: Telecomunicaţii, Electronică şi Informatică: proc. of the 5th intern. conf., May 20-23, 2015. Chişinău, 2015, pp. 130-131. ISBN 978-9975-45-377-6. en_US
dc.identifier.isbn 978-9975-45-377-6
dc.identifier.uri http://repository.utm.md/handle/5014/3545
dc.description.abstract In this paper pseudo-ring testing of digital memory with LFSR on bases of reducible polynomial is described. Resolution of this kind of pseudo-ring tests is presented for stuckat and coupled faults, and comparative analysis was performed regarding classical pseudo-ring tests. en_US
dc.language.iso ru en_US
dc.publisher Technical University of Moldova en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject linear-feedback shift register en_US
dc.subject LFSR en_US
dc.subject pseudo-ring tests en_US
dc.subject reducible polynomial en_US
dc.subject π-testing en_US
dc.subject testarea memoriei digitale en_US
dc.subject polinome reductibile en_US
dc.subject teste pseudo-inel en_US
dc.subject π-testare en_US
dc.subject тестирование цифровой памяти en_US
dc.subject приводимый полином en_US
dc.subject π-тестирование en_US
dc.title Π-тестирование с применением LFSR на основе приводимых полиномов en_US
dc.type Article en_US


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