REVUTSKA, L.; STRONSKI, A.; SHPORTKO, K.; PAIUK, O.; GUDYMENKO, O.; GUBANOVA, A.
(Tehnica UTM, 2019)
In this work X-ray diffraction (XRD) technique is employed to investigate the structural properties amorphous As-S-Sb, As-S-Ag and As-S-Ge chalcogenide glasses. The aim of this study is to perform analysis of parameters ...