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dc.contributor.author KOCH, Thomas
dc.date.accessioned 2019-10-21T10:08:23Z
dc.date.available 2019-10-21T10:08:23Z
dc.date.issued 2005
dc.identifier.citation KOCH, Thomas. AFM Tapping Mode Phase-Imaging of Carbon Nanotubes. In: Microelectronics and Computer Science: proc. of the 4th intern. conf., September 15-17, 2005. Chişinău, 2005, vol. 1, pp. 235-538. ISBN 9975-66-038-X. en_US
dc.identifier.isbn 9975-66-038-X
dc.identifier.uri http://repository.utm.md/handle/5014/4914
dc.description.abstract In the meantime AFM-imaging of carbon nanotubes has become a usual tool to get detailed information about the samples. This work introduces some new aspects in Tapping Mode Phase Imaging that may support the proper identification of SWNT samples. en_US
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject carbon nanotubes en_US
dc.subject samples en_US
dc.title AFM Tapping Mode Phase-Imaging of Carbon Nanotubes en_US
dc.type Article en_US


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