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Terahertz-Electronics with Particular Reference to Security Applications

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dc.contributor.author HARTNAGEL, Hans
dc.date.accessioned 2019-10-25T09:45:11Z
dc.date.available 2019-10-25T09:45:11Z
dc.date.issued 2013
dc.identifier.citation HARTNAGEL, Hans. Terahertz-Electronics with Particular Reference to Security Applications. In: ICNBME-2013. International Conference on Nanotechnologies and Biomedical Engineering. German-Moldovan Workshop on Novel Nanomaterials for Electronic, Photonic and Biomedical Applications: proc. of the 2th intern. conf., April 18-20, 2013. Chişinău, 2013, p. 60. ISBN 978-9975-62-343-8. en_US
dc.identifier.isbn 978-9975-62-343-8
dc.identifier.uri http://repository.utm.md/handle/5014/5273
dc.description.abstract Electromagnetic signals at Terahertz frequencies have the advantage that their photon energies are in the low milli-electronvolt range and therefore not capable of breaking up organic molecules of living cells. Therefore they have been considered for many applications such as airport surveillance. These scanners can detect metals such as those of weapons hidden under clothing from a distance of several meters, without exposing the persons to harmful radiation. THz spectroscopy is used to characterize many materials, including packaging, explosives and drugs. A recent application has been to characterize single-wall nanotube thin film electrodes. In another approach, using a separate pump beam to excite charge carriers in a material shortly before the THz analysis is carried out, information about ultrafast carrier dynamics may be obtained. A recent example of such time-resolved THz measurement deals with poly (3-hexylthiophene) and methanofullerene blended films. en_US
dc.language.iso en en_US
dc.publisher Tehnica UTM en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject airport en_US
dc.subject security applications en_US
dc.subject THz spectroscopy en_US
dc.title Terahertz-Electronics with Particular Reference to Security Applications en_US
dc.type Article en_US


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