dc.contributor.author | BAKERENKOV, Alexander | |
dc.date.accessioned | 2019-10-25T10:20:23Z | |
dc.date.available | 2019-10-25T10:20:23Z | |
dc.date.issued | 2011 | |
dc.identifier.citation | BAKERENKOV, Alexander. The Fitting Parameters Extraction of Conversion Model of the Low Dose Rate Effect in Bipolar Devices. In: ICNBME-2011. International conference on Nanotechnologies and Biomedical Engineering. German-moldovan workshop on Novel Nanomaterials for Electronic, Photonic and Biomedical Applications: proc. of the intern. conf., July 7-8, 2011. Chişinău, 2011, pp. 236-238. ISBN 978-9975-66-239-0. | en_US |
dc.identifier.isbn | 978-9975-66-239-0 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/5281 | |
dc.description.abstract | The Enhanced Low Dose Rate Sensitivity (ELDRS) in bipolar devices consists of in base current degradation of NPN and PNP transistors increase as the dose rate is decreased [1]. As a result of almost 20-year studying, the some physical models of effect are developed, being described in [2] in detail. Accelerated test methods, based on these models use in standards [3, 4]. In [5] the conversion model of the effect, that allows to describe the inverse S-shaped excess base current dependence versus dose rate, was proposed. This paper presents the problem of conversion model’s fitting parameters extraction. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Technical University of Moldova | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | Enhanced Low Dose Rate Sensitivity | en_US |
dc.subject | ELDRS | en_US |
dc.subject | bipolar devices | en_US |
dc.title | The Fitting Parameters Extraction of Conversion Model of the Low Dose Rate Effect in Bipolar Devices | en_US |
dc.type | Article | en_US |
The following license files are associated with this item: