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The Fitting Parameters Extraction of Conversion Model of the Low Dose Rate Effect in Bipolar Devices

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dc.contributor.author BAKERENKOV, Alexander
dc.date.accessioned 2019-10-25T10:20:23Z
dc.date.available 2019-10-25T10:20:23Z
dc.date.issued 2011
dc.identifier.citation BAKERENKOV, Alexander. The Fitting Parameters Extraction of Conversion Model of the Low Dose Rate Effect in Bipolar Devices. In: ICNBME-2011. International conference on Nanotechnologies and Biomedical Engineering. German-moldovan workshop on Novel Nanomaterials for Electronic, Photonic and Biomedical Applications: proc. of the intern. conf., July 7-8, 2011. Chişinău, 2011, pp. 236-238. ISBN 978-9975-66-239-0. en_US
dc.identifier.isbn 978-9975-66-239-0
dc.identifier.uri http://repository.utm.md/handle/5014/5281
dc.description.abstract The Enhanced Low Dose Rate Sensitivity (ELDRS) in bipolar devices consists of in base current degradation of NPN and PNP transistors increase as the dose rate is decreased [1]. As a result of almost 20-year studying, the some physical models of effect are developed, being described in [2] in detail. Accelerated test methods, based on these models use in standards [3, 4]. In [5] the conversion model of the effect, that allows to describe the inverse S-shaped excess base current dependence versus dose rate, was proposed. This paper presents the problem of conversion model’s fitting parameters extraction. en_US
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject Enhanced Low Dose Rate Sensitivity en_US
dc.subject ELDRS en_US
dc.subject bipolar devices en_US
dc.title The Fitting Parameters Extraction of Conversion Model of the Low Dose Rate Effect in Bipolar Devices en_US
dc.type Article en_US


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