Low dose rate effects in bipolar devices during longterm operation space electronic systems

Abstract

The maintenance of uninterrupted successful operation space system for navigation and investigation of different astronomic objective (planets, universes, nebulas) demands the development of on-board electronic systems which have possibility for long-term working in radiation ionizing space environments. During impact of the long-term radiation the two kinds low dose rate effects were observed: enhanced [1] and reduced [2] degradation of electrical characteristics of bipolar devices at the same total absorbed dose. It denotes as ELDRS (Enhanced Low Dose Rate Sensitivity) and RLDRS (Reduced Low Dose Rate Sensitivity). In given work the physical mechanisms of these low dose rate effects are considered. This kind of investigation can serve as the base for development of the testing methods for input control of bipolar microelectronic devices for on-board electronic system application.