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Low dose rate effects in bipolar devices during longterm operation space electronic systems

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dc.contributor.author PERSHENKOV, Viacheslav
dc.contributor.author BAKERENKOV, Alexander
dc.contributor.author FELITSYN, Vladislav
dc.contributor.author RODIN, Alexander
dc.contributor.author TELETS, Vitaliy
dc.contributor.author BELYAKOV, Vladimir
dc.contributor.author ZHUKOV, Alexander
dc.date.accessioned 2019-11-02T12:35:38Z
dc.date.available 2019-11-02T12:35:38Z
dc.date.issued 2019
dc.identifier.citation PERSHENKOV, Viacheslav, BAKERENKOV, Alexander, FELITSYN, Vladislav et al. Low dose rate effects in bipolar devices during longterm operation space electronic systems. In: Electronics, Communications and Computing: extended abstracts of the 10th Intern. Conf.: the 55th anniversary of Technical University of Moldova, Chişinău, October 23-26, 2019. Chişinău, 2019, p. 55. ISBN 978-9975-108-84-3. en_US
dc.identifier.isbn 978-9975-108-84-3
dc.identifier.uri http://repository.utm.md/handle/5014/5913
dc.description Abstract en_US
dc.description.abstract The maintenance of uninterrupted successful operation space system for navigation and investigation of different astronomic objective (planets, universes, nebulas) demands the development of on-board electronic systems which have possibility for long-term working in radiation ionizing space environments. During impact of the long-term radiation the two kinds low dose rate effects were observed: enhanced [1] and reduced [2] degradation of electrical characteristics of bipolar devices at the same total absorbed dose. It denotes as ELDRS (Enhanced Low Dose Rate Sensitivity) and RLDRS (Reduced Low Dose Rate Sensitivity). In given work the physical mechanisms of these low dose rate effects are considered. This kind of investigation can serve as the base for development of the testing methods for input control of bipolar microelectronic devices for on-board electronic system application. en_US
dc.language.iso en en_US
dc.publisher Tehnica UTM en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject interface traps en_US
dc.subject low dose rate en_US
dc.subject conversion model en_US
dc.title Low dose rate effects in bipolar devices during longterm operation space electronic systems en_US
dc.type Article en_US


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  • 2019
    Extended Abstracts of the: The 10th IC|ECCO; October 23-26, 2019

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Attribution-NonCommercial-NoDerivs 3.0 United States Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 United States

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