Charge transport peculiarities of amorphous Te films

Abstract

The charge transport in thin amorphous tellurium films was studied from investigation of temperature effect on both direct (DC) and alternating (AC) electrical conductivity. The films were grown by vacuum thermal evaporation of pure tellurium (99.9%) on Pirex substrates and / or sintered alumina ceramics. The morphology, micro-structural and phase-state analyses were performed using scanning electron microscopy and X-ray diffraction, which have shown that the films were amorphous with insignificant crystals traces.