dc.contributor.author | KOSTKA, P. | |
dc.contributor.author | ZAVADIL, J. | |
dc.contributor.author | GLADKOV, P. | |
dc.contributor.author | YATSKIV, R. | |
dc.date.accessioned | 2019-11-08T11:38:56Z | |
dc.date.available | 2019-11-08T11:38:56Z | |
dc.date.issued | 2019 | |
dc.identifier.citation | KOSTKA, P., ZAVADIL, J., GLADKOV, P., YATSKIV, R. Broad band excitation of RE3+ ions doped into tellurite and antimonite glasses. In: Amorphous and Nanostructured Chalcogenides. Abstract Book: proc. of the 9th International Conference, 30 June - 4 July, 2019. Chişinău, 2019, p. 16. | en_US |
dc.identifier.uri | http://repository.utm.md/handle/5014/6440 | |
dc.description | Abstract | en_US |
dc.description.abstract | Ternary TeO2-ZnO-TiO2 glasses doped with thulium (Tm) and antimonite glasses Sb2O3-PbO-ZnO/ZnS doped with ErCl3 were prepared by using melt quenching method and investigated by means of transmission, and room and low-temperature photoluminescence (PL) spectroscopy. For PL excitation we used 514.5 and/or 532 nm lines, i.e. the wavelengths capable to excite the electronic structure of both studied host glass systems but not in resonance with 4f levels of Tm3+ ions. We were able to observe simultaneously the broad-band luminescence of the host glass and the narrow features due to 4f-4f transitions in RE3+ ions. Special attention was given to the wavelengths range where the broad-band luminescence of the host glass overlaps with 4f-4f transitions within RE3+ ions. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Tehnica UTM | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | ternary TeO2-ZnO-TiO2 glasses | en_US |
dc.subject | antimonite glasses Sb2O3-PbO-ZnO/ZnS | en_US |
dc.subject | thulium (Tm) | en_US |
dc.subject | ErCl3 | en_US |
dc.subject | RE3+ ions | en_US |
dc.title | Broad band excitation of RE3+ ions doped into tellurite and antimonite glasses | en_US |
dc.type | Article | en_US |
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