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The analysis of Nb and Cu41Ni59 - alloy thin films by atomic force microscopy
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| dc.contributor.author | MORARI, R. | |
| dc.contributor.author | AWAWDEH, A. | |
| dc.contributor.author | ZDRAVKOV, V. | |
| dc.contributor.author | MORARI, C. | |
| dc.contributor.author | SIDORENKO, A. | |
| dc.date.accessioned | 2019-12-04T10:49:41Z | |
| dc.date.available | 2019-12-04T10:49:41Z | |
| dc.date.issued | 2012 | |
| dc.identifier.citation | MORARI, R., AWAWDEH, A., ZDRAVKOV, V. et al. The analysis of Nb and Cu41Ni59 - alloy thin films by atomic force microscopy. In: Telecommunications, Electronics and Informatics- ICTEI 2012: proc. of the 5th intern. conf., Technical University of Moldova, May 11-13, 2012. Chișinău, 2012, Vol. 1, pp. 82-87. ISBN 978-9975-45-082-9. | en_US |
| dc.identifier.isbn | 978-9975-45-082-9 | |
| dc.identifier.uri | http://repository.utm.md/handle/5014/7238 | |
| dc.description.abstract | This work is one part of a whole project for elaboration of a superconducting spinswitch. At a certain stage there was the need to develop technologies of magnetron sputtering of mirror-smooth film structures. AFM microscope acted as feedback for controlling the quality of the surface of films and for correction of deposition regimes. The paper is a detailed review of the deposition regimes of each layer (superconducting Nb and ferromagnetic alloy Cu41Ni59), and also the basic description of the work on the AFM microscope. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Technical University of Moldova | en_US |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
| dc.subject | spintronics | en_US |
| dc.subject | magnetron sputtering | en_US |
| dc.subject | sputtering | en_US |
| dc.subject | surface topographic models | en_US |
| dc.subject | thin films | en_US |
| dc.title | The analysis of Nb and Cu41Ni59 - alloy thin films by atomic force microscopy | en_US |
| dc.type | Article | en_US |
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