dc.contributor.author | TIRON, A. V. | |
dc.date.accessioned | 2020-05-22T10:04:28Z | |
dc.date.available | 2020-05-22T10:04:28Z | |
dc.date.issued | 2019 | |
dc.identifier.citation | TIRON, A. V. Refractive Index in the Region of Excitonic Resonances in TlGaSe2 Crystals. In: ICNMBE: International conference on Nanotechnologies and Biomedical Engineering: proc. of the 4rd intern. conf., Sept. 18-21 : Program & Abstract Book , 2019. Chişinău, 2019, p. 101. ISBN 978-9975-72-392-3. | en_US |
dc.identifier.issn | 978-9975-72-392-3 | |
dc.identifier.uri | https://doi.org/10.1007/978-3-030-31866-6_16 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/8323 | |
dc.description | Access full text - https://doi.org/10.1007/978-3-030-31866-6_16 | en_US |
dc.description.abstract | The low-temperature transmission and wavelength modulated transmission spectra of ТlGaSе2 crystals with a thickness of 7, 5.7, 4.7 μm were measured. Refractive index was calculated from interference observed in transmission spectra. The spectral dependences of the normal dispersion nа (Е║а) and nв (Е║в) and Δn = nа (Е║а) - nв (Е║в) on the long- wavelength and short-wave side of the ground states A, B and C of excitons are determined. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Tehnica UTM | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | chalcogenides | en_US |
dc.subject | optical spectroscopy | en_US |
dc.subject | refractive index | en_US |
dc.title | Refractive Index in the Region of Excitonic Resonances in TlGaSe2 Crystals | en_US |
dc.type | Article | en_US |
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