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Оценка качества псевдо-кольцевого тестирования устройств оперативной памяти

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dc.contributor.author ГРИЦКОВ, Сергей
dc.contributor.author СОРОКИН, Герман
dc.date.accessioned 2019-03-21T10:26:49Z
dc.date.available 2019-03-21T10:26:49Z
dc.date.issued 2013
dc.identifier.citation ГРИЦКОВ, Сергей, СОРОКИН, Герман. Оценка качества псевдо-кольцевого тестирования устройств оперативной памяти In: Conferința Tehnico-Științifică a Colaboratorilor, Doctoranzilor și Studenților, Universitatea Tehnică a Moldovei, 15-17 noiembrie, 2012. Chișinău, 2013, vol. 1, pp. 40-43. ISBN 978-9975-45-249-6. ISBN 978-9975-45-250-2 (Vol.1). en_US
dc.identifier.isbn 978-9975-45-249-6
dc.identifier.uri http://repository.utm.md/handle/5014/1157
dc.description.abstract The paper deals with the determination of the quality of pseudo-ring testing estimated by a simulation based on FPGA of pseudo-ring tests as well as single and multiple stack-at faults of memory devices. Is considered the transition from simulation based on the software tools to modeling based on the hardware ones. en_US
dc.language.iso ru en_US
dc.publisher Tehnica UTM en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject псевдо-кольцевое тестирование en_US
dc.subject качество тестирования en_US
dc.subject константные неисправности en_US
dc.subject система моделирования en_US
dc.title Оценка качества псевдо-кольцевого тестирования устройств оперативной памяти en_US
dc.type Article en_US


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