Автоматизация Процесса Измерения Оптических и Фотоэлектрических Свойств Полупроводников

Abstract

Measuring complex on the basis of УМ-2 monochromator and microcontroller Mega 8 was built; there was organized 10-bit word algorithm transfer on interface RS-232, there was carried out the possibility of automatic transition to a rough measuring mode, and the software for the management and control installation was written.