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Автоматизация Процесса Измерения Оптических и Фотоэлектрических Свойств Полупроводников

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dc.contributor.author ДЕМИДЕНКО, И.В.
dc.date.accessioned 2020-11-26T15:34:08Z
dc.date.available 2020-11-26T15:34:08Z
dc.date.issued 2015
dc.identifier.citation ДЕМИДЕНКО, И.В. Автоматизация Процесса Измерения Оптических и Фотоэлектрических Свойств Полупроводников. In: Telecomunicaţii, Electronică şi Informatică: proc. of the 5th intern. conf., May 20-23, 2015. Chişinău, 2015, pp. 128-129. ISBN 978-9975-45-377-6. en_US
dc.identifier.isbn 978-9975-45-377-6
dc.identifier.uri http://repository.utm.md/handle/5014/11791
dc.description.abstract Measuring complex on the basis of УМ-2 monochromator and microcontroller Mega 8 was built; there was organized 10-bit word algorithm transfer on interface RS-232, there was carried out the possibility of automatic transition to a rough measuring mode, and the software for the management and control installation was written. en_US
dc.language.iso ru en_US
dc.publisher Technical University of Moldova en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject микроконтроллер en_US
dc.subject пин en_US
dc.subject порт en_US
dc.subject аналого-цифровой преобразователь en_US
dc.subject энкодер en_US
dc.title Автоматизация Процесса Измерения Оптических и Фотоэлектрических Свойств Полупроводников en_US
dc.type Article en_US


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