DSpace Repository
Автоматизация Процесса Измерения Оптических и Фотоэлектрических Свойств Полупроводников
JavaScript is disabled for your browser. Some features of this site may not work without it.
| dc.contributor.author | ДЕМИДЕНКО, И.В. | |
| dc.date.accessioned | 2020-11-26T15:34:08Z | |
| dc.date.available | 2020-11-26T15:34:08Z | |
| dc.date.issued | 2015 | |
| dc.identifier.citation | ДЕМИДЕНКО, И.В. Автоматизация Процесса Измерения Оптических и Фотоэлектрических Свойств Полупроводников. In: Telecomunicaţii, Electronică şi Informatică: proc. of the 5th intern. conf., May 20-23, 2015. Chişinău, 2015, pp. 128-129. ISBN 978-9975-45-377-6. | en_US |
| dc.identifier.isbn | 978-9975-45-377-6 | |
| dc.identifier.uri | http://repository.utm.md/handle/5014/11791 | |
| dc.description.abstract | Measuring complex on the basis of УМ-2 monochromator and microcontroller Mega 8 was built; there was organized 10-bit word algorithm transfer on interface RS-232, there was carried out the possibility of automatic transition to a rough measuring mode, and the software for the management and control installation was written. | en_US |
| dc.language.iso | ru | en_US |
| dc.publisher | Technical University of Moldova | en_US |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
| dc.subject | микроконтроллер | en_US |
| dc.subject | пин | en_US |
| dc.subject | порт | en_US |
| dc.subject | аналого-цифровой преобразователь | en_US |
| dc.subject | энкодер | en_US |
| dc.title | Автоматизация Процесса Измерения Оптических и Фотоэлектрических Свойств Полупроводников | en_US |
| dc.type | Article | en_US |
Files in this item
The following license files are associated with this item:
This item appears in the following Collection(s)
Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 United States