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Testarea compactă RAM: instrumentar şi rezultate

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dc.contributor.author BODEAN, G.
dc.date.accessioned 2019-04-09T10:59:33Z
dc.date.available 2019-04-09T10:59:33Z
dc.date.issued 2008
dc.identifier.citation BODEAN, G. Testarea compactă RAM: instrumentar şi rezultate. In: Meridian Ingineresc. 2008, nr. 3, pp. 26-33. ISSN 1683-853X. en_US
dc.identifier.issn 1683-853X
dc.identifier.uri http://repository.utm.md/handle/5014/1697
dc.description.abstract Testarea pseudo-inelară sau Pi-testarea este o tehnică de testare compactă a memoriei cu acces aleatoriu (RAM), inclusiv şi a celei incorporate. Pi-testarea constă în executarea unei sau mai multe iteraţii în cadrul cărora un automat linear este emulat de însăşi memoria testată. Sintetizarea Pi-testului se reduce la definirea schemei de testare – ring sau scan, şi setarea parametrilor de structură, traiectorie, stare iniţială etc. Lucrarea descrie Pi-testele defectărilor unicelulare şi bice-lulare statice şi unicelulare dinamice. Pi-testul defectărilor unicelulare statice conţine 5 iteraţii de complexitatea 3N, al defectărilor bicelulare statice – 15 iteraţii, iar al defectărilor unicelulare dinamice – 10 iteraţii en_US
dc.description.abstract Pseudo-ring or Pi-testing is a technique of compact testing random access memory (RAM) as well as embedded memory. Pi-testing consists in performing one or more iterations where a linear automaton is emulated by the memory itself. Synthesis of Pi-test algorithm is reduced to select the testing scheme – ring or scan, and setup its parameters such as structure, trajectory, seed and others. This paper presents the -tests for all single-cell static and dynamic faults, also for all static two-cell faults. The Pi-test of static single-cell faults contains 5 iterations each of them with length equal to 3N, where N is the RAM array size. Two-cell static Pi-test contains 15 iterations that also can detect a part of dynamic single-cell faults. en
dc.description.abstract Pseudo-circulaire ou le Pi-test représente la méthode du test compact des mémoires RAM y compris la mémoire insérée. L'essence du Pi-test - l'exécution d'un ou les plus itérations de test, dans le cadre de qui par les moyens de la mémoire émailler l'automate linéaire. Le résultat de l'itération, i.e. l'état de l'automate virtuel, est comparé à l'état attendu. Dans l’article sont présentés les Pi-tests pour la détection des pannes (faults) statiques de la cellule (5 itérations) et inter-influence des cellules (10 itérations), ainsi que les pannes dynamiques de la cellule (15 itérations), où la longueur de chaque itération fait la valeur 3N. fr
dc.description.abstract Псевдокольцевое или Pi-тестирование представляет собой методику компактного тестирования оперативных запоминающих устройств (ОЗУ), в том числе и встроенных ОЗУ. Результат итерации, т.е. состояние виртуального автомата, сравнивается с ожидаемым состоянием. Синтез Pi-теста сводится к выбору схемы тестирования – кольцевое или сканирующее, и заданию структурных параметров, траектории, начальных состояний и др. В работе представлены Pi-тесты для обнаружения статических неисправностей ячейки (5 итераций) и взаимовлияния ячеек (10 итераций), а также динамических неисправностей ячейки (15 итераций). ru
dc.language.iso ro en_US
dc.publisher Editura U.T.M. en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject random access memory en_US
dc.subject RAM en_US
dc.subject memorie cu acces aleatoriu en_US
dc.title Testarea compactă RAM: instrumentar şi rezultate en_US
dc.title.alternative Compact Testing of RAM: Tools and Results en_US
dc.title.alternative Le test compact de la mémoire RAM : les moyens et les résultats en_US
dc.title.alternative Компактное тестирование ОЗУ: средства и результаты en_US
dc.type Article en_US


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