Abstract:
Nanostructured films of ZnO and Al-doped ZnO have been deposited using a successive chemical solution (SCS) method. The as-deposited nanostructured films were subjected to photothermal annealing at the temperature of 300 for 5 minutes. The morphological, structural, vibrational and chemical proprieties were investigated by scanning electron microscopy (SEM), X-ray diffraction (XRD), micro-Raman spectroscopy and EDX techniques. Dopant incorporation was demonstrated by the EDX measurements of Al-doped ZnO nanostructured films.