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Device and method for measuring the resistance of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts

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dc.contributor.author VERJBIŢKI, Valeri
dc.contributor.author LUPAN, Oleg
dc.contributor.author RAILEAN, Serghei
dc.date.accessioned 2022-05-25T07:35:48Z
dc.date.available 2022-05-25T07:35:48Z
dc.date.issued 2020
dc.identifier.citation VERJBIŢKI, Valeri, LUPAN, Oleg, RAILEAN, Serghei. Device and method for measuring the resistance of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts. In: European Exhibition of Creativity and Innovation: proc. of the 12th ed. EUROINVENT, Iasi, Romania, 2020, p. 165. ISSN 2601-4564. e-ISSN 2601-4572. en_US
dc.identifier.issn 2601-4564
dc.identifier.issn 2601-4572
dc.identifier.uri http://repository.utm.md/handle/5014/20399
dc.description Patent number MD 1269 Z, 2018.07.31. Exibits Clasification: 1. Environment - Pollution Control. en_US
dc.description.abstract The device comprises an adjustable reference voltage source connected to the output of a microcontroller and connected in series to the investigated nanostructured sensor and to the reference resistor, the connection point of which to the investigated sensor is connected to the input of the microcontroller. The method consists in: measuring the voltage of the reference voltage source, measuring the voltage drop across the reference resistor, calculating the voltage drop across the investigated nanostructure. Current flowing through the nanostructure and the applied power to the nanostructure are calculated and it is set the value of the reference voltage so that the electrical power will not exceed the maximum permitted value. en_US
dc.language en
dc.publisher Romanian Inventors Forum en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject invenţii en_US
dc.subject inventions en_US
dc.subject voltage sources en_US
dc.subject reference voltage source en_US
dc.subject nanostructures en_US
dc.subject semiconductor oxides en_US
dc.subject sensors en_US
dc.title Device and method for measuring the resistance of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts en_US
dc.type Article en_US


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  • 2020
    Proceedings of the 12 th Edition of European Exhibition of Creativity and Innovation, Romania

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Attribution-NonCommercial-NoDerivs 3.0 United States Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 United States

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