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Device for measuring the parameters of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts

Device for measuring the parameters of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts

VERJBIŢKI, Valeri; LUPAN, Oleg; RAILEAN, Serghei
URI: http://repository.utm.md/handle/5014/20429
Date: 2019

Abstract:

The device for measuring the parameters of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts comprises an adjustable reference voltage source, connected in series to a test sensor and a standard resistance.

Description:

Patent: MD 1270 Z 2018.07.31. Exibits Clasification: 1. Environment - Pollution Control.

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  • 2019
    Proceedings of the 11th Edition of European Exhibition of Creativity and Innovation, Romania
Attribution-NonCommercial-NoDerivs 3.0 United States Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 United States

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