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Device for measuring the parameters of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts

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dc.contributor.author VERJBIŢKI, Valeri
dc.contributor.author LUPAN, Oleg
dc.contributor.author RAILEAN, Serghei
dc.date.accessioned 2022-05-26T09:47:55Z
dc.date.available 2022-05-26T09:47:55Z
dc.date.issued 2019
dc.identifier.citation VERJBIŢKI, Valeri, LUPAN, Oleg, RAILEAN Serghei. Device for measuring the parameters of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts. In: European Exhibition of Creativity and Innovation: proc. of the 11th ed. EUROINVENT, Iasi, Romania, 2019, p. 178. ISSN 2601-4564. e-ISSN 2601-4572. en_US
dc.identifier.issn 2601-4564
dc.identifier.issn 2601-4572
dc.identifier.uri http://repository.utm.md/handle/5014/20429
dc.description Patent: MD 1270 Z 2018.07.31. Exibits Clasification: 1. Environment - Pollution Control. en_US
dc.description.abstract The device for measuring the parameters of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts comprises an adjustable reference voltage source, connected in series to a test sensor and a standard resistance. en_US
dc.language en
dc.publisher Romanian Inventors Forum en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject invenţii en_US
dc.subject inventions en_US
dc.subject nanostructured semiconductor oxides en_US
dc.subject sensors en_US
dc.subject microcontrollers en_US
dc.title Device for measuring the parameters of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts en_US
dc.type Article en_US


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  • 2019
    Proceedings of the 11th Edition of European Exhibition of Creativity and Innovation, Romania

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Attribution-NonCommercial-NoDerivs 3.0 United States Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 United States

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