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Device and method for measuring the resistance of sensors based on nanostructured semiconductor oxides

Device and method for measuring the resistance of sensors based on nanostructured semiconductor oxides

VERJBIŢKI, Valeri; LUPAN, Oleg
URI: http://repository.utm.md/handle/5014/20440
Date: 2018

Abstract:

The invention relates to the field of measuring equipment and can be used in measuring apparatuses that use sensors based on nanostructured semiconductor oxides.

Description:

Patent: MD 1065 Y 2016.08.31. Exibits Clasification: 1. Environment - Pollution Control.

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  • 2018
    Proceedings of the 10th Edition of European Exhibition of Creativity and Innovation, Romania
Attribution-NonCommercial-NoDerivs 3.0 United States Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 United States

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