dc.contributor.author | VERJBIŢKI, Valeri | |
dc.contributor.author | LUPAN, Oleg | |
dc.contributor.author | RAILEAN, Serghei | |
dc.date.accessioned | 2022-05-27T10:09:51Z | |
dc.date.available | 2022-05-27T10:09:51Z | |
dc.date.issued | 2018 | |
dc.identifier.citation | VERJBIŢKI, Valeri, LUPAN, Oleg, RAILEAN, Serghei. The device and method for measuring the parameters of nanosensors based on semiconductor nanostructured oxides in the range of microwatts. In: European Exhibition of Creativity and Innovation: proc. of the 10th ed. EUROINVENT, Iasi, Romania, 2018, p. 188. ISSN 2601-4564. e-ISSN 2601-4572. | en_US |
dc.identifier.issn | 2601-4564 | |
dc.identifier.issn | 2601-4572 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/20453 | |
dc.description | Application s 2017 0139, 2017.12.27. Patent: http://www.db.agepi.md/Inventions/details/s%202017%200139. Exibits Clasification: 1. Environment - Pollution Control. | en_US |
dc.description.abstract | The device for measuring the resistance of nanostructure of semiconductor oxide sensors includes an adjustable reference voltage source connected to a series-connected nanostructure Rx and a reference resistance R0, the voltage drop of which is applied to the inputs of the microprocessor's analog-to-digital converters (ADC). | en_US |
dc.language | en | |
dc.publisher | Romanian Inventors Forum | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | invenţii | en_US |
dc.subject | inventions | en_US |
dc.subject | semiconductor oxide sensors | en_US |
dc.subject | nanostructures | en_US |
dc.title | The device and method for measuring the parameters of nanosensors based on semiconductor nanostructured oxides in the range of microwatts | en_US |
dc.type | Article | en_US |
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