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The influence of gallium (Ga) content on morphological, structural and optical properties of indium tin oxide thin films
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| dc.contributor.author | MORARI, Vadim | |
| dc.contributor.author | KUTUZAU, Maksim | |
| dc.date.accessioned | 2022-08-09T07:55:07Z | |
| dc.date.available | 2022-08-09T07:55:07Z | |
| dc.date.issued | 2022 | |
| dc.identifier.citation | MORARI, Vadim, KUTUZAU, Maksim. The influence of gallium (Ga) content on morphological, structural and optical properties of indium tin oxide thin films. In: Conferinţa tehnico-ştiinţifică a studenţilor, masteranzilor şi doctoranzilor = Technical Scientific Conference of Undergraduate, Master and PhD Students, Universitatea Tehnică a Moldovei, 29-31 martie 2022. Chișinău, 2022, vol. 1, pp. 230-234. ISBN 978-9975-45-828-3. ISBN 978-9975-45-829-0 (Vol.1). | en_US |
| dc.identifier.isbn | 978-9975-45-828-3 | |
| dc.identifier.isbn | 978-9975-45-829-0 | |
| dc.identifier.uri | http://repository.utm.md/handle/5014/20655 | |
| dc.description.abstract | This paper reports on preparation of ITO thin films with different concentrations of Ga by spay pyrolysis method on Si (100) substrates. The morphology of the prepared films was studied using scanning electron microscope (SEM), and the quantitative chemical composition was determined using energy dispersive X-ray spectroscopy (EDX). X-ray diffraction (XRD) measurements were carried out on Bruker D8 Advance X-Ray Diffractometer with CoKα radiation (λ=0.1789 nm) in the 2Θ region of 20° - 90°. The optical properties of ITO:Ga thin films were measured using a Jasco V-670 spectrometer at room temperature (300 K). | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Universitatea Tehnică a Moldovei | en_US |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
| dc.subject | indium tin oxide | en_US |
| dc.subject | thin films | en_US |
| dc.title | The influence of gallium (Ga) content on morphological, structural and optical properties of indium tin oxide thin films | en_US |
| dc.type | Article | en_US |
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Subsecţia Microelectronică şi Nanotehnologii
MICROELECTRONICS AND NANOTECHNOLOGIES SUBSECTION
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