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Method of digital λ-modulated spectroscopy

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dc.contributor.author SÎRBU, Nicolae
dc.contributor.author STAMOV, Igor
dc.contributor.author DOROGAN, Andrei
dc.contributor.author DOROGAN, Valerian
dc.contributor.author ZALAMAI, Victor
dc.date.accessioned 2022-09-01T09:20:53Z
dc.date.available 2022-09-01T09:20:53Z
dc.date.issued 2014
dc.identifier.citation SÎRBU, Nicolae, STAMOV, Igor, DOROGAN, Andrei et al. Method of digital λ-modulated spectroscopy. In: European Exhibition of Creativity and Innovation: proc. of the 6th ed. EUROINVENT, Iasi, Romania, 2014, p. 86. ISBN: 978-606-714-037-8. en_US
dc.identifier.isbn 978-606-714-037-8
dc.identifier.uri http://repository.utm.md/handle/5014/20971
dc.description In the process of patenting. Class no.: 5. Industrial and laboratory equipments en_US
dc.description.abstract The elaborated method gives the possibility to determine the energy of electronic transitions in semiconductors at a high resolution for estimating an interference spectra structure for analyzing ordinary and extraordinary light dispersion in crystals. The used optic system allows data registering with a spectral width of the slit 0.02 Å (±0.01 meV) using a double Raman spectrometer СДЛ- 1 and МДР-2, which has the linear dispersion of 7Å/mm and relative aperture 1:2. en_US
dc.language.iso en en_US
dc.publisher Romanian Inventors Forum en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject invenţii en_US
dc.subject inventions en_US
dc.subject spectroscopy en_US
dc.subject electronic transitions en_US
dc.subject semiconductors en_US
dc.subject light dispersion en_US
dc.title Method of digital λ-modulated spectroscopy en_US
dc.type Article en_US


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  • 2014
    Proceedings of the 6th Edition of European Exhibition of Creativity and Innovation, Romania

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Attribution-NonCommercial-NoDerivs 3.0 United States Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 United States

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