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Radiation Effects in Low Dimensional Semiconductor Structures

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dc.contributor.author SOBOLEV, Nikolai A.
dc.date.accessioned 2024-01-05T08:47:40Z
dc.date.available 2024-01-05T08:47:40Z
dc.date.issued 2009
dc.identifier.citation SOBOLEV, Nikolai A. Radiation Effects in Low Dimensional Semiconductor Structures. In: Microelectronics and Computer Science: proc. 6th International Conference, 1-3 Oct. 2009, Chişinău, Republica Moldova, vol. 1, 2009, pp. 53-56. ISBN 978-9975-45-045-4. ISBN 978-9975-45-122-2 (vol. 1). en_US
dc.identifier.isbn 978-9975-45-045-4
dc.identifier.isbn 978-9975-45-122-2
dc.identifier.uri http://repository.utm.md/handle/5014/25718
dc.description.abstract The paper presents a survey of effects occurring in Si-Ge and III-V quantum dots, quantum wells, quantum wires and superlattices upon electron and proton irradiation as well as upon ion implantation. The important issue of the radiation hardness is treated in detail. It is shown that QD-based devices can withstand much higher radiation fluences than corresponding 2D and bulk structures. The physical mechanisms of this phenomenon are discussed. Coherent amorphization of superlattices and its relation to the ion-induced intermixing are considered. Examples of the application of particle irradiation to the device technology, especially, self-organized creation of nanopatterns and ion-beam synthesis of embedded nanocrystals, are given. en_US
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.relation.ispartof Proceeding of the 6th International Conference on "Microelectronics and Computer Science", oct.1-3, 2009, Chişinău, Moldova
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject semiconductor structures en_US
dc.subject radiation hardness en_US
dc.subject radiation technology en_US
dc.subject ion beam synthesis en_US
dc.subject embedded nanocrystals en_US
dc.title Radiation Effects in Low Dimensional Semiconductor Structures en_US
dc.type Article en_US


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