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Fault Models for Phase Change Memory

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dc.contributor.author MOHAMMAD, Mohammad Gh.
dc.date.accessioned 2024-01-09T09:21:08Z
dc.date.available 2024-01-09T09:21:08Z
dc.date.issued 2009
dc.identifier.citation MOHAMMAD, Mohammad Gh. Fault Models for Phase Change Memory. In: Microelectronics and Computer Science: proc. 6th International Conference, 1-3 Oct. 2009, Chişinău, Republica Moldova, vol. 1, 2009, pp. 136-141. ISBN 978-9975-45-045-4. ISBN 978-9975-45-122-2 (vol. 1). en_US
dc.identifier.isbn 978-9975-45-045-4
dc.identifier.isbn 978-9975-45-122-2
dc.identifier.uri http://repository.utm.md/handle/5014/25742
dc.description.abstract Phase Change Memory (PCM) is the newest type of non-volatile memory that shall replace the currently wide spread flash memory. Recent research activities performed on PCM reliability and operation have identified special failure modes that are particular to this type of memory. In this paper, these failures are identified and their behavior is analyzed in order to develop appropriate fault models that describe their behavior using traditional memory fault notation. In addition, an efficient test algorithm, called March-PCM, is proposed to test all modeled faults. en_US
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.relation.ispartof Proceeding of the 6th International Conference on "Microelectronics and Computer Science", oct.1-3, 2009, Chişinău, Moldova
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject algorithms en_US
dc.subject fault models en_US
dc.subject March test en_US
dc.subject phase change memory en_US
dc.title Fault Models for Phase Change Memory en_US
dc.type Article en_US


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