Fault Models for Phase Change Memory

MOHAMMAD, Mohammad Gh.

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dc.contributor.author	MOHAMMAD, Mohammad Gh.
dc.date.accessioned	2024-01-09T09:21:08Z
dc.date.available	2024-01-09T09:21:08Z
dc.date.issued	2009
dc.identifier.citation	MOHAMMAD, Mohammad Gh. Fault Models for Phase Change Memory. In: Microelectronics and Computer Science: proc. 6th International Conference, 1-3 Oct. 2009, Chişinău, Republica Moldova, vol. 1, 2009, pp. 136-141. ISBN 978-9975-45-045-4. ISBN 978-9975-45-122-2 (vol. 1).	en_US
dc.identifier.isbn	978-9975-45-045-4
dc.identifier.isbn	978-9975-45-122-2
dc.identifier.uri	http://repository.utm.md/handle/5014/25742
dc.description.abstract	Phase Change Memory (PCM) is the newest type of non-volatile memory that shall replace the currently wide spread flash memory. Recent research activities performed on PCM reliability and operation have identified special failure modes that are particular to this type of memory. In this paper, these failures are identified and their behavior is analyzed in order to develop appropriate fault models that describe their behavior using traditional memory fault notation. In addition, an efficient test algorithm, called March-PCM, is proposed to test all modeled faults.	en_US
dc.language.iso	en	en_US
dc.publisher	Technical University of Moldova	en_US
dc.relation.ispartof	Proceeding of the 6th International Conference on "Microelectronics and Computer Science", oct.1-3, 2009, Chişinău, Moldova
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	algorithms	en_US
dc.subject	fault models	en_US
dc.subject	March test	en_US
dc.subject	phase change memory	en_US
dc.title	Fault Models for Phase Change Memory	en_US
dc.type	Article	en_US