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Omogenitatea – proprietate de bază a circuitelor digitale testabile

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dc.contributor.author COJOCARU, Ion
dc.contributor.author ŞERBANAŢI, Luca
dc.contributor.author PĂVĂLOIU, Bujor
dc.contributor.author RADOVICI, Alexandru
dc.contributor.author VASILOŢEANU, Andrei
dc.date.accessioned 2024-01-12T11:57:01Z
dc.date.available 2024-01-12T11:57:01Z
dc.date.issued 2009
dc.identifier.citation COJOCARU, Ion et al. Omogenitatea – proprietate de bază a circuitelor digitale testabile. In: Microelectronics and Computer Science: proc. 6th International Conference, 1-3 Oct. 2009, Chişinău, Republica Moldova, vol. 1, 2009, pp. 362-365. ISBN 978-9975-45-045-4. ISBN 978-9975-45-122-2 (vol. 1). en_US
dc.identifier.isbn 978-9975-45-045-4
dc.identifier.isbn 978-9975-45-122-2
dc.identifier.uri http://repository.utm.md/handle/5014/25819
dc.description.abstract Solving the problem of Design for Testability (DFT) supposes not just studying the modern promising ways, but deep studying of the different traditional aspects connected to synthesis of easy testable digital circuits (DC). An important particular case, is represented by the maximum degenerate homogenous digital structures (MDHDS), that are a particular case of regular DC, proposed by Gremalschi [1]. MDHDS are equivalent to a logical gate with the same number of entrances and the set of verification tests for these gates is at the same time the set of diagnosis tests. Study of the possibility for obtaining MDHDS relieved the necessity for introduction and utilization of such concepts as monotonous ascending logical function (MALF) and monotonous descending logical function (MDLF). The paper presents some structural and analytical aspects for solving the above-mentioned problem. en_US
dc.language.iso ro en_US
dc.publisher Technical University of Moldova en_US
dc.relation.ispartof Proceeding of the 6th International Conference on "Microelectronics and Computer Science", oct.1-3, 2009, Chişinău, Moldova
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject design for testability en_US
dc.subject monotonous function en_US
dc.subject unate structure en_US
dc.subject logical gate en_US
dc.subject test-equivalence en_US
dc.title Omogenitatea – proprietate de bază a circuitelor digitale testabile en_US
dc.type Article en_US


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