Abstract:
The problem of easy testable digital circuits’ design, which appeared in the 60s of the last century, being in the permanent focus of the digital circuits’ producers, has not found its adequate solution yet. Complexity of the problem, the insufficient results of design for testability (DFT) for general case and the lack of traditional methods of logical synthesis justify the search of non-traditional solutions in the field of interaction between different scientific directions. The fundament of new design for testing concept is represented by the logical gates couples. Properties of in- and out- signals of these gates couples allow a non-traditional and extremely efficient approach to DFT problem.