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Advanced analysis of copper nano-tips as cold field emission electron sources
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| dc.contributor.author | MOUSA, Marwan S. | |
| dc.contributor.author | ABUAMR, Adel M. | |
| dc.date.accessioned | 2024-04-24T12:07:20Z | |
| dc.date.available | 2024-04-24T12:07:20Z | |
| dc.date.issued | 2024 | |
| dc.identifier.citation | MOUSA Marwan S., ABUAMR, Adel M. Advanced analysis of copper nano-tips as cold field emission electron sources. In: Quo Vadis – Ethics of the Scientific Research: conf. NANO-2024, event devoted to the 60th anniversary of the Technical University of Moldova, 15-18 April 2024, Chişinău, Republica Moldova: Program and proceedings of the conference, Chişinău 2024, p. 35. ISBN 978-9975-64-422-8. | en_US |
| dc.identifier.isbn | 978-9975-64-422-8 | |
| dc.identifier.uri | http://repository.utm.md/handle/5014/26895 | |
| dc.description.abstract | Field electron emission measurements were performed on high purity copper emitters, with apex radii in the nanometer and micrometer ranges, produced by an electrochemical etching technique with phosphoric acid (H3PO4) solution. The measurements were carried out in a high vacuum in rande of 10-5 mbar. The current- voltage characteristics (I-V) have been studied and analyzed using Murphy–Good (MG) method type plots. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Technical University of Moldova | en_US |
| dc.relation.ispartofseries | NANO-2024 "Quo Vadis – Ethics of the Scientific Research", event devoted to the 60th anniversary of the Technical University of Moldova;15-18 April 2024, Chişinău, Republica Moldova | |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
| dc.subject | field electron emission | en_US |
| dc.subject | current-voltage characteristics | en_US |
| dc.subject | copper tips | en_US |
| dc.subject | high vacuum | en_US |
| dc.title | Advanced analysis of copper nano-tips as cold field emission electron sources | en_US |
| dc.type | Article | en_US |
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