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Electrical Noise and Semiconductor Reliability

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dc.contributor.author BĂJENESCU, Titu-Marius I.
dc.date.accessioned 2024-06-17T10:54:07Z
dc.date.available 2024-06-17T10:54:07Z
dc.date.issued 2023
dc.identifier.citation BĂJENESCU, Titu-Marius I. Electrical Noise and Semiconductor Reliability. In: Electrotehnica, Electronica, Automatica, 2024, vol. 71, pp. 51-58. e-ISSN 2392-828X. en_US
dc.identifier.issn 2392-828X
dc.identifier.uri https://doi.org/10.46904/eea.23.71.4.1108006
dc.identifier.uri http://repository.utm.md/handle/5014/27451
dc.description.abstract Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize noise in semiconductor devices. en_US
dc.language.iso en en_US
dc.publisher INCDIE ICPE-CA Romania en_US
dc.relation.ispartofseries Electrotehnica, Electronica, Automatica (EEA);2024, vol. 71
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject semiconductor devices en_US
dc.subject electrical noise en_US
dc.subject defects en_US
dc.subject single crystals en_US
dc.subject noise voltage en_US
dc.title Electrical Noise and Semiconductor Reliability en_US
dc.type Article en_US


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