dc.contributor.author | CIOBANU, M. | |
dc.contributor.author | GALCA, A. C. | |
dc.contributor.author | SAVA, F. | |
dc.contributor.author | ZAKI, M. Y. | |
dc.contributor.author | VELEA, A. | |
dc.contributor.author | TSIULYANU, D. | |
dc.date.accessioned | 2024-06-24T06:43:08Z | |
dc.date.available | 2024-06-24T06:43:08Z | |
dc.date.issued | 2023 | |
dc.identifier.citation | CIOBANU, M. et al. First Sharp Diffraction Peak features of the intermediate phase glasses and amorphous thin films in the non-stoichiometric (GeS4)x(AsS3)1-x system. In: Thin Solid Films, 2023, vol. 773, nr. 2, pp. 139828. e-ISSN 0040-6090. | en_US |
dc.identifier.issn | 0040-6090 | |
dc.identifier.uri | https://doi.org/10.1016/j.tsf.2023.139828 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/27570 | |
dc.description | Acces full text - https://doi.org/10.1016/j.tsf.2023.139828 | en_US |
dc.description.abstract | Grazing incidence X-ray scattering (GIXRS) patterns of thin solid films based on non-stoichiometric chalcogenide glasses (ChG) from the pseudo - binary system (GeS4)x(AsS3)1-x were studied with a focus on the First Sharp Diffraction Peak (FSDP), assigned to the middle range order (MRO) of the glassy material. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Elsevier | en_US |
dc.relation.ispartofseries | Thin Solid Films;2023, vol. 773 | |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | chalcogenides glasses | en_US |
dc.subject | thin solid films | en_US |
dc.title | First Sharp Diffraction Peak features of the intermediate phase glasses and amorphous thin films in the non-stoichiometric (GeS4)x(AsS3)1-x system | en_US |
dc.type | Article | en_US |
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