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Formation of ZnFe2O4/ZnO:Al thin film heterostructure with the peroxidase mimetic properties by RF-magnetron sputtering method

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dc.contributor.author GUTSUL, T.D.
dc.contributor.author LUPU, M.C.
dc.contributor.author MONAICO, E.I.
dc.contributor.author COSTRIUCOVA, N.V.
dc.contributor.author PODGORNII, D.O.
dc.date.accessioned 2024-11-27T12:26:49Z
dc.date.available 2024-11-27T12:26:49Z
dc.date.issued 2024
dc.identifier.citation GUTSUL, T. D.; M. C. LUPU; E.I. MONAICO; N.V. COSTRIUCOVA and D.O. PODGORNII. Formation of ZnFe2O4/ZnO:Al thin film heterostructure with the peroxidase mimetic properties by RF-magnetron sputtering method. In: Materials Science and Condensed-Matter Physics: MSCMP: 10th International Conference dedicated to the 60th anniversary from the foundation of the Institute of Applied Physics, October 1-4, 2024. Book of abstracts. Chişinău: CEP USM, 2024, p. 153. ISBN 978-9975-62-763-4. en_US
dc.identifier.isbn 978-9975-62-763-4
dc.identifier.uri http://repository.utm.md/handle/5014/28653
dc.description Only Abstract. en_US
dc.description.abstract In recent years analytical methods based on the catalytic activity of nanoparticles with the properties of the peroxidase mimetic, such as palladium nanoparticles, porous cobalt oxide nanostructures and others, have been successfully used to detect pollutants in the environment [1]. In our work we propose ZnFe2O4/ZnO:Al film heterostructures that were obtained by magnetron sputtering in an argon atmosphere as a mimetic of the peroxidase enzyme for the detection of hydrogen peroxide in model experiments. The morphology and chemical composition of ZnFe2O4/ZnO:Al thin films were studied using a Zeiss Sigma scanning electron microscope and Tescan Vega TS 5130MM equipped with an Oxford Instruments INCA energy dispersive X-ray system operating at a voltage of 20 kV. The study of the chemical composition obtained using X-ray spectroscopy (EDX) shows in the case of thin layer of ZnO:Al, along with the main elements Zn, O, Al, elements similar to glass (Ca, Si, Mg, O) as well as Zn, Fe, O, for ZnFe2O4/ZnO:Al film nanostructures. In Fig.1 (a) and (b) are presented SEM EDX of ZnO:Al thin film and ZnFe2O4/ZnO:Al heterostructure respectively. The comparison of the X-ray diffraction (Desktop X-ray diffractometer Miniflex 600 Rigaku) of the obtained thin films in Fig.2 (2) with a diffraction pattern from the JCPDS database No. 22-1012 presented in Fig.2 (3) shows the presence of peaks corresponding to (111), (220), (311), (222), (400), (422), (511), (440) phases of cubic spinel (Franklinite). In Fig.2 (1) specific peaks related to ZnO in the ZnFe2O4/ZnO:Al/glass heterostructure are presented. The ZnO sample shows the specific peaks at 2θ = 31.7° (100), 34.4° (002) and 56.5° (110) corresponding to the hexagonal structure of wurtzite type (ICDD No.01-078-2585). The peroxidase activity of the ZnFe2O4/ZnO:Al/glass films structure was studied using 3,3', 5,5'-tetramethylbenzidine (TMB) as a peroxidase substrate in the presence of H2O2 according to the procedure described in [2]. en_US
dc.language.iso en en_US
dc.publisher Institute of Applied Physics, Moldova State University en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject nanoparticles en_US
dc.subject RF-magnetron sputtering en_US
dc.subject peroxidase mimetic properties en_US
dc.title Formation of ZnFe2O4/ZnO:Al thin film heterostructure with the peroxidase mimetic properties by RF-magnetron sputtering method en_US
dc.type Article en_US


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