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Characterization of gas sensitive chalcogenide films by impedance spectroscopy

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dc.contributor.author TSIULYANU, Dumitru
dc.date.accessioned 2019-07-11T10:48:41Z
dc.date.available 2019-07-11T10:48:41Z
dc.date.issued 2017
dc.identifier.citation TSIULYANU, Dumitru. Characterization of gas sensitive chalcogenide films by impedance spectroscopy. In: Microelectronics and Computer Science: proc. of the 9th intern. conf., October 19-21, 2017. Chişinău, 2017, p. 477. ISBN 978-9975-4264-8-0. en_US
dc.identifier.isbn 978-9975-4264-8-0
dc.identifier.uri http://repository.utm.md/handle/5014/3445
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject chalcogenide films en_US
dc.subject impedance en_US
dc.subject spectroscopy en_US
dc.subject pelicule căldogenide en_US
dc.subject sensibilitate la gaze en_US
dc.subject spectroscopie en_US
dc.subject impedanță en_US
dc.title Characterization of gas sensitive chalcogenide films by impedance spectroscopy en_US
dc.type Article en_US


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