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Algorithmic Complexity of Pseudo-Ring Testing for Stuck-at Faults

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dc.contributor.author GRIŢCOV, Serghei
dc.date.accessioned 2019-07-15T09:13:58Z
dc.date.available 2019-07-15T09:13:58Z
dc.date.issued 2015
dc.identifier.citation GRIŢCOV, Serghei. Algorithmic Complexity of Pseudo-Ring Testing for Stuck-at Faults. In: Telecomunicaţii, Electronică şi Informatică: proc. of the 5th intern. conf., May 20-23, 2015. Chişinău, 2015, pp. 75-76. ISBN 978-9975-45-377-6. en_US
dc.identifier.isbn 978-9975-45-377-6
dc.identifier.uri http://repository.utm.md/handle/5014/3529
dc.description.abstract This paper describes calculation of algorithmic complexity of pseudo-ring testing obtained by simulation of stuck-at faults and realization of pseudo-ring testing of 4-bit and 8-bit memory. The method is designed for both bit- and wordoriented memory and it is invariant to the width of data bus of the memory. en_US
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject pseudo-ring testing en_US
dc.subject algorithmic complexity en_US
dc.subject stuck-at faults en_US
dc.subject bit width invariance en_US
dc.subject generators polynomials en_US
dc.subject teste cu pseudo-inele en_US
dc.title Algorithmic Complexity of Pseudo-Ring Testing for Stuck-at Faults en_US
dc.type Article en_US


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