Algorithmic Complexity of Pseudo-Ring Testing for Stuck-at Faults

dc.contributor.author	GRIŢCOV, Serghei
dc.date.accessioned	2019-07-15T09:13:58Z
dc.date.available	2019-07-15T09:13:58Z
dc.date.issued	2015
dc.identifier.citation	GRIŢCOV, Serghei. Algorithmic Complexity of Pseudo-Ring Testing for Stuck-at Faults. In: Telecomunicaţii, Electronică şi Informatică: proc. of the 5th intern. conf., May 20-23, 2015. Chişinău, 2015, pp. 75-76. ISBN 978-9975-45-377-6.	en_US
dc.identifier.isbn	978-9975-45-377-6
dc.identifier.uri	http://repository.utm.md/handle/5014/3529
dc.description.abstract	This paper describes calculation of algorithmic complexity of pseudo-ring testing obtained by simulation of stuck-at faults and realization of pseudo-ring testing of 4-bit and 8-bit memory. The method is designed for both bit- and wordoriented memory and it is invariant to the width of data bus of the memory.	en_US
dc.language.iso	en	en_US
dc.publisher	Technical University of Moldova	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	pseudo-ring testing	en_US
dc.subject	algorithmic complexity	en_US
dc.subject	stuck-at faults	en_US
dc.subject	bit width invariance	en_US
dc.subject	generators polynomials	en_US
dc.subject	teste cu pseudo-inele	en_US
dc.title	Algorithmic Complexity of Pseudo-Ring Testing for Stuck-at Faults	en_US
dc.type	Article	en_US