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Investigation of registration of the optical information in the amorphous As-Se thin films
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| dc.contributor.author | IOVU, M. S. | |
| dc.contributor.author | CIORBA, V. G. | |
| dc.contributor.author | COLOMEICO, E. P. | |
| dc.contributor.author | NASTAS, A. M. | |
| dc.contributor.author | PRISACAR, A. M. | |
| dc.date.accessioned | 2019-10-18T12:25:10Z | |
| dc.date.available | 2019-10-18T12:25:10Z | |
| dc.date.issued | 2005 | |
| dc.identifier.citation | GASHIN, P., KETRUSH, P., NIKORICH, V. et al. Electrical properties of CuInSe2 crystals obtained by gas transport method. In: Microelectronics and Computer Science: proc. of the 4th intern. conf., September 15-17, 2005. Chişinău, 2005, vol. 1, pp. 109-112. ISBN 9975-66-038-X. | en_US |
| dc.identifier.isbn | 9975-66-038-X | |
| dc.identifier.uri | http://repository.utm.md/handle/5014/4854 | |
| dc.description.abstract | The effect of light-induced photodarkening in amorphous As100-xSex (x=40÷98) thin films for different thickness and film composition was investigated. It was established a strong dependence of the red shift of the absorption edge and refractive index under light irradiation on the film composition and thermal treatment. It was established that the more sensitive films to photodarkening and holographic recording correspond to non-stoichiometric compositions of As55Se45 and As60Se40 glasses. The experimental results are interpreted in terms of structural optical polymerization process, which includes the transformation of As4Se4 and Se2 structural units in homogenius AsSe3/2 network. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Technical University of Moldova | en_US |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
| dc.subject | amorphous thin films | en_US |
| dc.subject | thin films | en_US |
| dc.title | Investigation of registration of the optical information in the amorphous As-Se thin films | en_US |
| dc.type | Article | en_US |
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