JavaScript is disabled for your browser. Some features of this site may not work without it.
| dc.contributor.author | KOCH, Thomas | |
| dc.date.accessioned | 2019-10-21T10:08:23Z | |
| dc.date.available | 2019-10-21T10:08:23Z | |
| dc.date.issued | 2005 | |
| dc.identifier.citation | KOCH, Thomas. AFM Tapping Mode Phase-Imaging of Carbon Nanotubes. In: Microelectronics and Computer Science: proc. of the 4th intern. conf., September 15-17, 2005. Chişinău, 2005, vol. 1, pp. 235-538. ISBN 9975-66-038-X. | en_US |
| dc.identifier.isbn | 9975-66-038-X | |
| dc.identifier.uri | http://repository.utm.md/handle/5014/4914 | |
| dc.description.abstract | In the meantime AFM-imaging of carbon nanotubes has become a usual tool to get detailed information about the samples. This work introduces some new aspects in Tapping Mode Phase Imaging that may support the proper identification of SWNT samples. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Technical University of Moldova | en_US |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
| dc.subject | carbon nanotubes | en_US |
| dc.subject | samples | en_US |
| dc.title | AFM Tapping Mode Phase-Imaging of Carbon Nanotubes | en_US |
| dc.type | Article | en_US |
Files in this item
The following license files are associated with this item:
This item appears in the following Collection(s)
Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 United States