Analysis of plasmid deletion induced by ionizing radiation in yeast saccharomyces cerevisiae

BELOCOPITOVA, K.; KOLTOVAYA, N.

DSpace Home
→
Facultatea Calculatoare, Informatică şi Microelectronică
→
Conferinţe
→
Conferinţa ICNBME - International Conference on Nanotechnologies and Biomedical Engineering
→
2013
→
View Item

dc.contributor.author	BELOCOPITOVA, K.
dc.contributor.author	KOLTOVAYA, N.
dc.date.accessioned	2019-10-25T12:42:56Z
dc.date.available	2019-10-25T12:42:56Z
dc.date.issued	2013
dc.identifier.citation	BELOCOPITOVA, K., KOLTOVAYA, N. Analysis of plasmid deletion induced by ionizing radiation in yeast saccharomyces cerevisiae. In: ICNBME-2013. International Conference on Nanotechnologies and Biomedical Engineering. German-Moldovan Workshop on Novel Nanomaterials for Electronic, Photonic and Biomedical Applications: proc. of the 2th intern. conf., April 18-20, 2013. Chişinău, 2013, pp. 480-481. ISBN 978-9975-62-343-8.	en_US
dc.identifier.isbn	978-9975-62-343-8
dc.identifier.uri	http://repository.utm.md/handle/5014/5327
dc.description.abstract	The objective of this study is to determine the mutagenic effects of ionizing radiation. As a model [1] we used a plasmid system for quantitative analysis of deletion formation. A can1 cyh2 cell on a YCp plasmid (with two negative markers: the CAN1 and CYH2 genes) is sensitive to canavanine and cycloheximide. This cell becomes resistant to both drugs when the plasmid has a deletion over the CAN1 and CYH2 genes.	en_US
dc.language.iso	en	en_US
dc.publisher	Tehnica UTM	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	mutagenic effects	en_US
dc.subject	ionizing radiation	en_US
dc.subject	genetic analysis	en_US
dc.title	Analysis of plasmid deletion induced by ionizing radiation in yeast saccharomyces cerevisiae	en_US
dc.type	Article	en_US