Abstract:
The maintenance of uninterrupted successful operation space system for navigation and
investigation of different astronomic objective (planets, universes, nebulas) demands the
development of on-board electronic systems which have possibility for long-term working in
radiation ionizing space environments. During impact of the long-term radiation the two kinds
low dose rate effects were observed: enhanced [1] and reduced [2] degradation of electrical
characteristics of bipolar devices at the same total absorbed dose. It denotes as ELDRS (Enhanced
Low Dose Rate Sensitivity) and RLDRS (Reduced Low Dose Rate Sensitivity). In given work the
physical mechanisms of these low dose rate effects are considered. This kind of investigation can
serve as the base for development of the testing methods for input control of bipolar
microelectronic devices for on-board electronic system application.