Investigation of thin optically anisotropic ZnO films placed in a strong uniform magnetic field

Abstract

We present the results of IR spectroscopy and attenuated total reflection (ATR) investigations of the properties of polar optically anisotropic ZnO films on hexagonal 6H-SiC single crystals. The ATR and IR reflection spectra were taken using a spectrophotometer ИКС-31 with an attachment ИПО-22 and НПВО-2, in the actual frequency region for ZnO film (400600 cm-1) and 6H-SiC substrate (788−970 cm-1).