dc.contributor.author | VENGER, E. F. | |
dc.contributor.author | IEVTUSHENKO, A. I. | |
dc.contributor.author | MELNICHUK, L. Yu. | |
dc.contributor.author | MELNICHUK, O. V. | |
dc.date.accessioned | 2019-11-06T14:03:47Z | |
dc.date.available | 2019-11-06T14:03:47Z | |
dc.date.issued | 2011 | |
dc.identifier.citation | VENGER, E. F., IEVTUSHENKO, A. I., MELNICHUK, L. Yu. Investigation of thin optically anisotropic ZnO films placed in a strong uniform magnetic field. In: Microelectronics and Computer Science: proc. of the 7th intern. Conf., September 22-24, 2011. Chişinău, 2011, vol. 1, p. 103. ISBN 978-9975-45-174-1. | en_US |
dc.identifier.isbn | 978-9975-45-174-1 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/6253 | |
dc.description.abstract | We present the results of IR spectroscopy and attenuated total reflection (ATR) investigations of the properties of polar optically anisotropic ZnO films on hexagonal 6H-SiC single crystals. The ATR and IR reflection spectra were taken using a spectrophotometer ИКС-31 with an attachment ИПО-22 and НПВО-2, in the actual frequency region for ZnO film (400600 cm-1) and 6H-SiC substrate (788−970 cm-1). | en_US |
dc.language.iso | en | en_US |
dc.publisher | Technical University of Moldova | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | spectroscopy | en_US |
dc.subject | attenuated reflection | en_US |
dc.subject | films | en_US |
dc.subject | single crystals | en_US |
dc.title | Investigation of thin optically anisotropic ZnO films placed in a strong uniform magnetic field | en_US |
dc.type | Article | en_US |
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