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Investigation of thin optically anisotropic ZnO films placed in a strong uniform magnetic field

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dc.contributor.author VENGER, E. F.
dc.contributor.author IEVTUSHENKO, A. I.
dc.contributor.author MELNICHUK, L. Yu.
dc.contributor.author MELNICHUK, O. V.
dc.date.accessioned 2019-11-06T14:03:47Z
dc.date.available 2019-11-06T14:03:47Z
dc.date.issued 2011
dc.identifier.citation VENGER, E. F., IEVTUSHENKO, A. I., MELNICHUK, L. Yu. Investigation of thin optically anisotropic ZnO films placed in a strong uniform magnetic field. In: Microelectronics and Computer Science: proc. of the 7th intern. Conf., September 22-24, 2011. Chişinău, 2011, vol. 1, p. 103. ISBN 978-9975-45-174-1. en_US
dc.identifier.isbn 978-9975-45-174-1
dc.identifier.uri http://repository.utm.md/handle/5014/6253
dc.description.abstract We present the results of IR spectroscopy and attenuated total reflection (ATR) investigations of the properties of polar optically anisotropic ZnO films on hexagonal 6H-SiC single crystals. The ATR and IR reflection spectra were taken using a spectrophotometer ИКС-31 with an attachment ИПО-22 and НПВО-2, in the actual frequency region for ZnO film (400600 cm-1) and 6H-SiC substrate (788−970 cm-1). en_US
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject spectroscopy en_US
dc.subject attenuated reflection en_US
dc.subject films en_US
dc.subject single crystals en_US
dc.title Investigation of thin optically anisotropic ZnO films placed in a strong uniform magnetic field en_US
dc.type Article en_US


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