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Физический механизм генерации НЧ-шума в полупроводниковых барьерных структурах

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dc.contributor.author ХОЛОМИНА, Т. А.
dc.date.accessioned 2019-12-06T11:26:49Z
dc.date.available 2019-12-06T11:26:49Z
dc.date.issued 2012
dc.identifier.citation ХОЛОМИНА, Т. А. Физический механизм генерации НЧ-шума в полупроводниковых барьерных структурах. In: Telecommunications, Electronics and Informatics - ICTEI 2012: proc. of the 5th intern. conf., Technical University of Moldova, May 11-13, 2012. Chișinău, 2012, Vol. 1, pp. 315-320. ISBN 978-9975-45-082-9. en_US
dc.identifier.isbn 978-9975-45-082-9
dc.identifier.uri http://repository.utm.md/handle/5014/7331
dc.description.abstract Results of the theoretical and experimental justification and development of activation-drift model of relaxation processes low-frequency noise generation in physical barrier layers, and also the method of noise spectroscopy of deep levels are summarized. en_US
dc.language.iso ru en_US
dc.publisher Technical University of Moldova en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject активационно-дрейфовые модели en_US
dc.subject низкочастотный шум en_US
dc.subject шум en_US
dc.subject полупроводниковые структуры en_US
dc.subject полупроводники en_US
dc.title Физический механизм генерации НЧ-шума в полупроводниковых барьерных структурах en_US
dc.type Article en_US


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