Abstract:
Cd2SnO4 thin films with a 1:1 and 1:3 Sn/Cd weight ratio at different substrate temperatures were fabricated by spray pyrolysis. The structural and surface composition of these films by X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) were investigated. XRD study reveals tetragonal and orthorhombic phases of SnO2 and cubic phase of Cd2SnO4. In all samples the grain size of the crystallites of the SnO2 phase is smaller than that of the Cd2SnO4 phase. The grain size of the crystallites of Cd2SnO4 cubic phase decreases with increasing the substrate temperatures. The full range XPS spectra of all Cd2SnO4 thin films contain the Sn3p, Sn3d, O1s, Cd3d and O2s characteristic peaks.
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