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XRD and XPS of Cd2SnO4 Thin Films Obtained by Spray Pyrolysis

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dc.contributor.author POTLOG, T.
dc.contributor.author BOTNARIUC, V.
dc.contributor.author RAEVSCHI, S.
dc.contributor.author DOBROMIR, M.
dc.contributor.author LUCA, D.
dc.date.accessioned 2020-05-15T08:23:55Z
dc.date.available 2020-05-15T08:23:55Z
dc.date.issued 2015
dc.identifier.citation POTLOG, T., BOTNARIUC, V., RAEVSCHI, S. et al. XRD and XPS of Cd2SnO4 Thin Films Obtained by Spray Pyrolysis. In: ICNMBE: International conference on Nanotechnologies and Biomedical Engineering: proc. of the 3rd intern. conf., Sept. 23-26 : Program & Abstract Book , 2015. Chişinău, 2015, p. 80. en_US
dc.identifier.uri https://doi.org/10.1007/978-981-287-736-9_10
dc.identifier.uri http://repository.utm.md/handle/5014/8212
dc.description Access full text - https://doi.org/10.1007/978-981-287-736-9_10 en_US
dc.description.abstract Cd2SnO4 thin films with a 1:1 and 1:3 Sn/Cd weight ratio at different substrate temperatures were fabricated by spray pyrolysis. The structural and surface composition of these films by X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) were investigated. XRD study reveals tetragonal and orthorhombic phases of SnO2 and cubic phase of Cd2SnO4. In all samples the grain size of the crystallites of the SnO2 phase is smaller than that of the Cd2SnO4 phase. The grain size of the crystallites of Cd2SnO4 cubic phase decreases with increasing the substrate temperatures. The full range XPS spectra of all Cd2SnO4 thin films contain the Sn3p, Sn3d, O1s, Cd3d and O2s characteristic peaks. en_US
dc.language.iso en en_US
dc.publisher Tehnica UTM en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject thin films en_US
dc.subject films en_US
dc.title XRD and XPS of Cd2SnO4 Thin Films Obtained by Spray Pyrolysis en_US
dc.type Article en_US


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