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The Circuit Method for Decreasing of Sensitivity to ASET Effect for Bipolar Operational Amplifiers

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dc.contributor.author LEBEDEV, A. A.
dc.contributor.author FELITSYN, V. A.
dc.contributor.author KOMLEVA, V. A.
dc.contributor.author KOMLEV, A. A.
dc.date.accessioned 2020-05-19T11:43:23Z
dc.date.available 2020-05-19T11:43:23Z
dc.date.issued 2015
dc.identifier.citation LEBEDEV, A. A., FELITSYN, V. A., KOMLEVA, V. A. et al. The Circuit Method for Decreasing of Sensitivity to ASET Effect for Bipolar Operational Amplifiers. In: ICNMBE: International conference on Nanotechnologies and Biomedical Engineering: proc. of the 3rd intern. conf., Sept. 23-26 : Program & Abstract Book , 2015. Chişinău, 2015, p. 122. en_US
dc.identifier.uri https://doi.org/10.1007/978-981-287-736-9_126
dc.identifier.uri http://repository.utm.md/handle/5014/8292
dc.description Access full text - https://doi.org/10.1007/978-981-287-736-9_126 en_US
dc.description.abstract The schematic method for increasing of radiation hardness of bipolar operational amplifiers for ASET effects is presented. The method is based on the use of improved current mirror and modified input stage circuit. en_US
dc.language.iso en en_US
dc.publisher Tehnica UTM en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject single-event transients en_US
dc.subject operational amplifiers en_US
dc.subject common mode rejection ratio en_US
dc.subject differential stage en_US
dc.title The Circuit Method for Decreasing of Sensitivity to ASET Effect for Bipolar Operational Amplifiers en_US
dc.type Article en_US


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