The Circuit Method for Decreasing of Sensitivity to ASET Effect for Bipolar Operational Amplifiers

LEBEDEV, A. A.; FELITSYN, V. A.; KOMLEVA, V. A.; KOMLEV, A. A.

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dc.contributor.author	LEBEDEV, A. A.
dc.contributor.author	FELITSYN, V. A.
dc.contributor.author	KOMLEVA, V. A.
dc.contributor.author	KOMLEV, A. A.
dc.date.accessioned	2020-05-19T11:43:23Z
dc.date.available	2020-05-19T11:43:23Z
dc.date.issued	2015
dc.identifier.citation	LEBEDEV, A. A., FELITSYN, V. A., KOMLEVA, V. A. et al. The Circuit Method for Decreasing of Sensitivity to ASET Effect for Bipolar Operational Amplifiers. In: ICNMBE: International conference on Nanotechnologies and Biomedical Engineering: proc. of the 3rd intern. conf., Sept. 23-26 : Program & Abstract Book , 2015. Chişinău, 2015, p. 122.	en_US
dc.identifier.uri	https://doi.org/10.1007/978-981-287-736-9_126
dc.identifier.uri	http://repository.utm.md/handle/5014/8292
dc.description	Access full text - https://doi.org/10.1007/978-981-287-736-9_126	en_US
dc.description.abstract	The schematic method for increasing of radiation hardness of bipolar operational amplifiers for ASET effects is presented. The method is based on the use of improved current mirror and modified input stage circuit.	en_US
dc.language.iso	en	en_US
dc.publisher	Tehnica UTM	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	single-event transients	en_US
dc.subject	operational amplifiers	en_US
dc.subject	common mode rejection ratio	en_US
dc.subject	differential stage	en_US
dc.title	The Circuit Method for Decreasing of Sensitivity to ASET Effect for Bipolar Operational Amplifiers	en_US
dc.type	Article	en_US