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Refractive Index in the Region of Excitonic Resonances in TlGaSe2 Crystals

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dc.contributor.author TIRON, A. V.
dc.date.accessioned 2020-05-22T10:04:28Z
dc.date.available 2020-05-22T10:04:28Z
dc.date.issued 2019
dc.identifier.citation TIRON, A. V. Refractive Index in the Region of Excitonic Resonances in TlGaSe2 Crystals. In: ICNMBE: International conference on Nanotechnologies and Biomedical Engineering: proc. of the 4rd intern. conf., Sept. 18-21 : Program & Abstract Book , 2019. Chişinău, 2019, p. 101. ISBN 978-9975-72-392-3. en_US
dc.identifier.issn 978-9975-72-392-3
dc.identifier.uri https://doi.org/10.1007/978-3-030-31866-6_16
dc.identifier.uri http://repository.utm.md/handle/5014/8323
dc.description Access full text - https://doi.org/10.1007/978-3-030-31866-6_16 en_US
dc.description.abstract The low-temperature transmission and wavelength modulated transmission spectra of ТlGaSе2 crystals with a thickness of 7, 5.7, 4.7 μm were measured. Refractive index was calculated from interference observed in transmission spectra. The spectral dependences of the normal dispersion nа (Е║а) and nв (Е║в) and Δn = nа (Е║а) - nв (Е║в) on the long- wavelength and short-wave side of the ground states A, B and C of excitons are determined. en_US
dc.language.iso en en_US
dc.publisher Tehnica UTM en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject chalcogenides en_US
dc.subject optical spectroscopy en_US
dc.subject refractive index en_US
dc.title Refractive Index in the Region of Excitonic Resonances in TlGaSe2 Crystals en_US
dc.type Article en_US


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