Complex Nanostructured Materials

Abstract

Today’s advanced materials are coined by structural, chemical and functional properties that require combined approaches of cutting-edge methods for their characterization. In order to determine the structures on multiscales several techniques have to be combined synergistically, e.g. atomic resolution transmission electron microscopy (TEM), X-ray- and Synchrotron-based analyses. In this contribution several complex nanostructured materials will be discussed in respect to their real structure – property relationships.